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IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)
Title: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)
Link: http://tima.imag.fr/conferences/dft/
Category: Main > Conferences

Summary:
Annual symposium for discussions on design, manufacturing, test, reliability and availability that are affected by defects during manufacturing and by faults during system operation. Topics include defect and fault tolerance issues, error detection and recovery, yield and dependability analysis and modelling, testing techniques, yield enhancement techniques, applications and case studies.

Description:
Sorry no available detailed description.

 
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